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The semiconductor industry includes the design and fabrication of semiconductors and semiconductor devices, such as transistors and integrated circuits. 

The fabrication process normally divided into several steps, Wafer fabrication, frontend process, and backend process. It is highly sophisticated and the requirement if very stringent every step throughout the manufacturing processes. 

Core Solutions
Bruker Lumos II FTIR
Fourier Transform Infrared Spectroscopy | FTIR
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Filmtek 2000 PAR-SE
Ellipsometer
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Bruker Contour X1000
3D Optical / White Light Interferometer | WLI
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Proforma 300i
Wafer Thickness Measurement
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Bruker Anasys nanoIR3
Nanoscale Infrared Spectroscopy | NanoIR
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PHi 710 Auger Electron Spectroscopy
Auger Electron Spectroscopy | AES, SAM
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Nordson 4000plus
Bond Tester
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Hysitron TI 990 TriboIndenter
Nanomechanical Test Instruments
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Insidix TDM
Topography & Deformation Measurement
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Imina Probing
Nanoprobing SEM Solution
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Atomic Force Microscopes
Atomic Force Microscopes | AFM
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PHI nanoTOF 3
Time-of-Flight SIMS | TOF-SIMS
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MUST 3 Solderability Tester
Solderability Tester, Ionic Contaminometer, Auto SIR and Thermal Profiler
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Vanta GX
Benchtop Precious Metal X-Ray Fluorescence Analyzer | XRF
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VCA 3000s
Video Contact Angle System
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Evident DSX2000
High Resolution 3D Digital Microscopes
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Tescan UniTOM XL
Micro-CT
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Evident CIX100
Cleanliness & Particle Analysis
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Evident Industrial Measuring Microscope STM7
Industrial Measuring Microscopes
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Evident MX63
Semiconductor Wafer Inspection Microscope
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Evident SZX16
Industrial Stereo Microscopes
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Wafer Surface Analysis, Surface Contamination Identification (cleanliness) Using Contact Angle Measurement
Wafer Surface Analysis, Surface Contamination Identification (cleanliness) Using Contact Angle Measurement
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Evident OLS5100
Laser Confocal Microscopes
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Evident MX63
Semiconductor Flat Panel Handling & Display Inspection Microscope
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Industrial Light Microscopes
Industrial Light Microscopes
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ISPEED CAMERA
High Speed Video Cameras
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UltraMap UMA-C200 System
Non Contact Full Wafer Thickness Scanning Metrology
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semiconductor-metrology-system
Critical Wafer Metrology For Very Thin Wafers, Bumped Wafers, Mounted Wafers
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Evident Iplex
Remote Visual Inspection (RVI)
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Vanta Series
Handheld X-Ray Fluorescence Analyzer | XRF
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Analytical Probing
Analytical Probe Station & Accessories
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AST VCA 3000S Wafer Surface Analysis
Water Surface Analysis, Surface Contamination Identification (Cleanliness) Using Contact Angle Measurement
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FT200 Series
XRF Coating Thickness Analyzer
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Tescan Tensor
4D Scanning Transmission Electron Microscope | 4D-STEM
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Tescan Amber X
Focus Ion Beam Scanning Electron Microscope | FIB-SEM
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Manual X-Ray Inspection
Manual X-Ray Inspection
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Bruker Dektak Pro
Stylus Profilers
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Nordson AOI M2 Automated Optical Inspection System
Automated Optical Inspection Systems | AOI
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Nordson X Series
Automated X-Ray Inspection | AXI
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Tescan Clara
Desktop Scanning Electron Microscope | SEM
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Meritz Vibration Isolation System
Vibration Isolation System
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Sonoscan Gen 7
Automated and Stand Alone Scanning Acoustic Microscope

Automated and Standalone Scanning Acoustic Microscope (SAM) solution offers high-precision, non-destructive imaging for a variety of materials and components.

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Fuild Dispensing
Fluid Dispensing Solution
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IC Mold Decapsulation
Auto Chemical/Laser/Plasma IC Mold Decapsulator, Reactive Ion Etcher, Auto-Curve Tracer and IC Backside Etching System
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Nordson AP Batch Series
Plasma Treatment Systems
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Nordson FlexTrak
Advanced Plasma Cleaning Systems
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