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The semiconductor industry includes the design and fabrication of semiconductors and semiconductor devices, such as transistors and integrated circuits.
The fabrication process normally divided into several steps, Wafer fabrication, frontend process, and backend process. It is highly sophisticated and the requirement if very stringent every step throughout the manufacturing processes.
Core Solutions
Advanced Analytical & Testing Equipment
Dynamic SIMS / D-SIMS
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Fourier Transform Infrared Spectroscopy | FTIR
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Ellipsometer
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3D Optical / White Light Interferometer | WLI
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Wafer Thickness Measurement
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Nanoscale Infrared Spectroscopy | NanoIR
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Auger Electron Spectroscopy | AES, SAM
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Bond Tester
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Nanomechanical Test Instruments
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Topography & Deformation Measurement
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Nanoprobing SEM Solution
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Atomic Force Microscopes | AFM
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Time-of-Flight SIMS | TOF-SIMS
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Optical & Portable Equipment
Benchtop Precious Metal X-Ray Fluorescence Analyzer | XRF
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Video Contact Angle System
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High Resolution 3D Digital Microscopes
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Micro-CT
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Cleanliness & Particle Analysis
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Industrial Measuring Microscopes
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Semiconductor Wafer Inspection Microscope
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Industrial Stereo Microscopes
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Wafer Surface Analysis, Surface Contamination Identification (cleanliness) Using Contact Angle Measurement
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Laser Confocal Microscopes
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Semiconductor Flat Panel Handling & Display Inspection Microscope
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Industrial Light Microscopes
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High Speed Video Cameras
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Non Contact Full Wafer Thickness Scanning Metrology
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Critical Wafer Metrology For Very Thin Wafers, Bumped Wafers, Mounted Wafers
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Remote Visual Inspection (RVI)
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Handheld X-Ray Fluorescence Analyzer | XRF
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Analytical Probe Station & Accessories
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Water Surface Analysis, Surface Contamination Identification (Cleanliness) Using Contact Angle Measurement
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XRF Coating Thickness Analyzer
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4D Scanning Transmission Electron Microscope | 4D-STEM
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Advanced Imaging Equipment
Focus Ion Beam Scanning Electron Microscope | FIB-SEM
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Manual X-Ray Inspection
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Stylus Profilers
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Automated Optical Inspection Systems | AOI
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Automated X-Ray Inspection | AXI
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Desktop Scanning Electron Microscope | SEM
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Sample Management Equipment
Vibration Isolation System
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Automated and Stand Alone Scanning Acoustic Microscope
Automated and Standalone Scanning Acoustic Microscope (SAM) solution offers high-precision, non-destructive imaging for a variety of materials and components.
Fluid Dispensing Solution
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Auto Chemical/Laser/Plasma IC Mold Decapsulator, Reactive Ion Etcher, Auto-Curve Tracer and IC Backside Etching System
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Plasma Treatment Systems
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Advanced Plasma Cleaning Systems
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